X-ray microanalysis in the electron microscope / John A. Chandler.
Material type: TextSeries: Practical methods in electron microscopy: v. 5, pt. 2.Publisher: Amsterdam ; New York : New York : North-Holland Pub. Co. ; Distributed in the U.S. by Elsevier/North-Holland, 1977Edition: 1st edDescription: pages 317-547 : illustrationsISBN: 9780720406078; 0720406072; 0720442508; 9780720442502; 0720406056; 9780720406054Subject(s): X-rays -- Diffraction | Electron microscopes | Microscopy, Electron -- methods | X-Ray Diffraction -- methods | Microscopes electroniques a balayage -- Methodologie | Rayons X -- Diffraction -- Methodes | Electron microscopes | X-rays -- Diffraction | Microscopia Eletronica | Rayons X -- Diffraction | Microscopes electroniques | Elektronenmikroskop | Elektronenmikroskopie | Mikroanalyse | Rontgenmikroskopie | RontgenstrahlungDDC classification: 578.15 LOC classification: QH212.E4 | P72 v.5 pt.2Other classification: WC 3100Item type | Current location | Call number | Status | Date due | Barcode |
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Books | GKVK Library | 578.15 CHA (Browse shelf) | Withdrawn | 82846 |
Includes bibliographical references and index.
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