Field-ion microscopy / K. M. Bowkett and D. A. Smith. Textual Documents
Language: English Original language: Series: Defects in crystalline solidsPublisher: London : North-Holland Publishing Company , 1970Description: x, 257 p., tables, figsISBN: 72041752; 0444100040Subject(s): Microscopy | Field-Ion MicroscopyDDC classification: 578.4Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Books | GKVK Library | 578.4 BOW (Browse shelf) | 1 | Available | 40678 |
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